HIGH ASPECT RATIO TIP ATOMIC FORCE MICROSCOPY CANTILEVERS AND METHOD OF MANUFACTURE

The present invention provides a method for the selective growth of single carbon nanotubes (CNT) on the tip apex of a conventional cantilever. Selective CNT growth is established by coating the backside (8) of a cantilever, having a through-hole a tip apex, with a catalyst material followed by a co...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	SCHLAF, RUDIGER
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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