HIGH ASPECT RATIO TIP ATOMIC FORCE MICROSCOPY CANTILEVERS AND METHOD OF MANUFACTURE
The present invention provides a method for the selective growth of single carbon nanotubes (CNT) on the tip apex of a conventional cantilever. Selective CNT growth is established by coating the backside (8) of a cantilever, having a through-hole a tip apex, with a catalyst material followed by a co...
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| creator | SCHLAF, RUDIGER |
| description | The present invention provides a method for the selective growth of single carbon nanotubes (CNT) on the tip apex of a conventional cantilever. Selective CNT growth is established by coating the backside (8) of a cantilever, having a through-hole a tip apex, with a catalyst material followed by a cover layer. The exposed catalyst at the bottom of the hole at the apex of the cantilever induces growth of a single CNT at this location.
La présente invention concerne un procédé permettant la croissance sélective de nanotubes de carbone simples sur l'extrémité de la pointe d'un cantilever classique. La croissance sélective de nanotubes de carbone simples est obtenue par l'application d'une matière catalytique puis d'une couche de recouvrement sur la face arrière d'un cantilever, présentant un trou traversant au niveau d'une extrémité de pointe. Le catalyseur exposé au fond du trou au niveau de l'extrémité du cantilever provoque la croissance d'un nanotube de carbone simple à cet emplacement. |
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La présente invention concerne un procédé permettant la croissance sélective de nanotubes de carbone simples sur l'extrémité de la pointe d'un cantilever classique. La croissance sélective de nanotubes de carbone simples est obtenue par l'application d'une matière catalytique puis d'une couche de recouvrement sur la face arrière d'un cantilever, présentant un trou traversant au niveau d'une extrémité de pointe. Le catalyseur exposé au fond du trou au niveau de l'extrémité du cantilever provoque la croissance d'un nanotube de carbone simple à cet emplacement.</description><language>eng ; fre</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060706&DB=EPODOC&CC=WO&NR=2005059514A3$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060706&DB=EPODOC&CC=WO&NR=2005059514A3$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SCHLAF, RUDIGER</creatorcontrib><title>HIGH ASPECT RATIO TIP ATOMIC FORCE MICROSCOPY CANTILEVERS AND METHOD OF MANUFACTURE</title><description>The present invention provides a method for the selective growth of single carbon nanotubes (CNT) on the tip apex of a conventional cantilever. Selective CNT growth is established by coating the backside (8) of a cantilever, having a through-hole a tip apex, with a catalyst material followed by a cover layer. The exposed catalyst at the bottom of the hole at the apex of the cantilever induces growth of a single CNT at this location.
La présente invention concerne un procédé permettant la croissance sélective de nanotubes de carbone simples sur l'extrémité de la pointe d'un cantilever classique. La croissance sélective de nanotubes de carbone simples est obtenue par l'application d'une matière catalytique puis d'une couche de recouvrement sur la face arrière d'un cantilever, présentant un trou traversant au niveau d'une extrémité de pointe. Le catalyseur exposé au fond du trou au niveau de l'extrémité du cantilever provoque la croissance d'un nanotube de carbone simple à cet emplacement.</description><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SCANNING-PROBE TECHNIQUES OR APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEsDqK-w4GzUK0ZHI_rxQRsryRXxakUiZNoob4_OvgATv83_HOTfDh6wNQyKUTUIKChBVSpA4GTSAxfRUkk7RUIGw0nPnNMgE0FNauXCsRBjU3nkLSLvDSz-_CY8urXhVk7VvKbPL76PI3DLT_zu7_IrihsYQ92u8ey_O_6AKqnMLA</recordid><startdate>20060706</startdate><enddate>20060706</enddate><creator>SCHLAF, RUDIGER</creator><scope>EVB</scope></search><sort><creationdate>20060706</creationdate><title>HIGH ASPECT RATIO TIP ATOMIC FORCE MICROSCOPY CANTILEVERS AND METHOD OF MANUFACTURE</title><author>SCHLAF, RUDIGER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2005059514A33</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2006</creationdate><topic>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SCANNING-PROBE TECHNIQUES OR APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SCHLAF, RUDIGER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SCHLAF, RUDIGER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>HIGH ASPECT RATIO TIP ATOMIC FORCE MICROSCOPY CANTILEVERS AND METHOD OF MANUFACTURE</title><date>2006-07-06</date><risdate>2006</risdate><abstract>The present invention provides a method for the selective growth of single carbon nanotubes (CNT) on the tip apex of a conventional cantilever. Selective CNT growth is established by coating the backside (8) of a cantilever, having a through-hole a tip apex, with a catalyst material followed by a cover layer. The exposed catalyst at the bottom of the hole at the apex of the cantilever induces growth of a single CNT at this location.
La présente invention concerne un procédé permettant la croissance sélective de nanotubes de carbone simples sur l'extrémité de la pointe d'un cantilever classique. La croissance sélective de nanotubes de carbone simples est obtenue par l'application d'une matière catalytique puis d'une couche de recouvrement sur la face arrière d'un cantilever, présentant un trou traversant au niveau d'une extrémité de pointe. Le catalyseur exposé au fond du trou au niveau de l'extrémité du cantilever provoque la croissance d'un nanotube de carbone simple à cet emplacement.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre |
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| subjects | APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING |
| title | HIGH ASPECT RATIO TIP ATOMIC FORCE MICROSCOPY CANTILEVERS AND METHOD OF MANUFACTURE |
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