APPARATUS AND METHOD FOR DETERMINING PHYSICAL PROPERTIES OF FERROELECTRIC SINGLE CRYSTAL USING SPECTROSCOPIC ELLIPSOMETRY
Described in the present invention are an apparatus for determining physical properties of a ferroelectric single crystal comprising a series of an optical device, a temperature controlling device and a computer, and a method of determining the dielectric constant or phase transition temperature of...
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| creator | LEE, SANG-GOO EUN, JAEHWAN BANG, KYOUNG YOON RHIM, SUNG MIN |
| description | Described in the present invention are an apparatus for determining physical properties of a ferroelectric single crystal comprising a series of an optical device, a temperature controlling device and a computer, and a method of determining the dielectric constant or phase transition temperature of the single crystal using said apparatus.
La présente invention concerne un appareil permettant de déterminer des propriétés physiques d'un cristal unique ferroélectrique comprenant un ensemble qui englobe un dispositif optique, un dispositif de régulation thermique et un ordinateur. Cette invention a également trait à un procédé de détermination de la constante diélectrique ou de la température de transition de phase du cristal unique, à l'aide dudit appareil. |
| format | Patent |
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La présente invention concerne un appareil permettant de déterminer des propriétés physiques d'un cristal unique ferroélectrique comprenant un ensemble qui englobe un dispositif optique, un dispositif de régulation thermique et un ordinateur. Cette invention a également trait à un procédé de détermination de la constante diélectrique ou de la température de transition de phase du cristal unique, à l'aide dudit appareil.</description><edition>7</edition><language>eng ; fre</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2004</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040826&DB=EPODOC&CC=WO&NR=2004072623A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20040826&DB=EPODOC&CC=WO&NR=2004072623A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LEE, SANG-GOO</creatorcontrib><creatorcontrib>EUN, JAEHWAN</creatorcontrib><creatorcontrib>BANG, KYOUNG YOON</creatorcontrib><creatorcontrib>RHIM, SUNG MIN</creatorcontrib><title>APPARATUS AND METHOD FOR DETERMINING PHYSICAL PROPERTIES OF FERROELECTRIC SINGLE CRYSTAL USING SPECTROSCOPIC ELLIPSOMETRY</title><description>Described in the present invention are an apparatus for determining physical properties of a ferroelectric single crystal comprising a series of an optical device, a temperature controlling device and a computer, and a method of determining the dielectric constant or phase transition temperature of the single crystal using said apparatus.
La présente invention concerne un appareil permettant de déterminer des propriétés physiques d'un cristal unique ferroélectrique comprenant un ensemble qui englobe un dispositif optique, un dispositif de régulation thermique et un ordinateur. Cette invention a également trait à un procédé de détermination de la constante diélectrique ou de la température de transition de phase du cristal unique, à l'aide dudit appareil.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2004</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNzcEKwjAQBNBePIj6DwuehdqKnkO6sYHYXTYp0lMpEk-ihXrx703BD_A0DPNgltlHMStRofWgmgouGGqqwJBAhQHlYhvbnIHrzlutHLAQowSLHsiAQRFChzqI1eCTdAhaOh8SbecOnueVvCZOBJ2z7Cm9SLfOFvfhMcXNL1fZ1mDQ9S6Orz5O43CLz_jur1Tk-SE_FceiVPvyP_UFJuA8Ag</recordid><startdate>20040826</startdate><enddate>20040826</enddate><creator>LEE, SANG-GOO</creator><creator>EUN, JAEHWAN</creator><creator>BANG, KYOUNG YOON</creator><creator>RHIM, SUNG MIN</creator><scope>EVB</scope></search><sort><creationdate>20040826</creationdate><title>APPARATUS AND METHOD FOR DETERMINING PHYSICAL PROPERTIES OF FERROELECTRIC SINGLE CRYSTAL USING SPECTROSCOPIC ELLIPSOMETRY</title><author>LEE, SANG-GOO ; EUN, JAEHWAN ; BANG, KYOUNG YOON ; RHIM, SUNG MIN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_WO2004072623A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre</language><creationdate>2004</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LEE, SANG-GOO</creatorcontrib><creatorcontrib>EUN, JAEHWAN</creatorcontrib><creatorcontrib>BANG, KYOUNG YOON</creatorcontrib><creatorcontrib>RHIM, SUNG MIN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LEE, SANG-GOO</au><au>EUN, JAEHWAN</au><au>BANG, KYOUNG YOON</au><au>RHIM, SUNG MIN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS AND METHOD FOR DETERMINING PHYSICAL PROPERTIES OF FERROELECTRIC SINGLE CRYSTAL USING SPECTROSCOPIC ELLIPSOMETRY</title><date>2004-08-26</date><risdate>2004</risdate><abstract>Described in the present invention are an apparatus for determining physical properties of a ferroelectric single crystal comprising a series of an optical device, a temperature controlling device and a computer, and a method of determining the dielectric constant or phase transition temperature of the single crystal using said apparatus.
La présente invention concerne un appareil permettant de déterminer des propriétés physiques d'un cristal unique ferroélectrique comprenant un ensemble qui englobe un dispositif optique, un dispositif de régulation thermique et un ordinateur. Cette invention a également trait à un procédé de détermination de la constante diélectrique ou de la température de transition de phase du cristal unique, à l'aide dudit appareil.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | APPARATUS AND METHOD FOR DETERMINING PHYSICAL PROPERTIES OF FERROELECTRIC SINGLE CRYSTAL USING SPECTROSCOPIC ELLIPSOMETRY |
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