PATTERNED ILLUMINATION METHOD AND APPARATUS FOR MACHINE VISION SYSTEMS

This application relates to an apparatus (Fig. 3) and method for providing patterned illumination fields for use within process control and article inspection applications. More specifically, it pertains to the use of patterned illuminators (90, 110) to enable visual surface inspection of polished o...

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Bibliographische Detailangaben
Hauptverfasser:	BOOHER, JESSE, GRAVES, TERRY, L, PALOMBO, THOMAS, H, CECH, STEVEN, D, COCHRAN, DON, W, YODER, MICHAEL, L
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ALARM SYSTEMS BASIC ELECTRIC ELEMENTS BLASTING CALCULATING COMPUTING COUNTING COUNTING MECHANISMS COUNTING OF OBJECTS NOT OTHERWISE PROVIDED FOR DETECTING MASSES OR OBJECTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMSTHEREOF GEOPHYSICS GRAVITATIONAL MEASUREMENTS HEATING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LIGHTING MEASURING MECHANICAL ENGINEERING ORDER TELEGRAPHS PHYSICS SIGNALLING SIGNALLING OR CALLING SYSTEMS STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHERARTICLES, NOT OTHERWISE PROVIDED FOR TESTING WEAPONS
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Beschreibung
Zusammenfassung:	This application relates to an apparatus (Fig. 3) and method for providing patterned illumination fields for use within process control and article inspection applications. More specifically, it pertains to the use of patterned illuminators (90, 110) to enable visual surface inspection of polished objects (30)such as ball bearings. The use of patterned illuminators properly disposed in relation to a polished part under inspection allows small surface imperfections such as scratches and pits to become visible against the normal surface background. The use of carefully engineered illuminators facilitates advantageous defect-site scattering from generally dark field sources. The patterned nature of the illuminators defined by this invention allows the complete surface (55) of three-dimensional parts to be effectively highlighted using dark field illumination fields. L'invention concerne un appareil et un procédé permettant d'obtenir des champs d'éclairage à motifs à utiliser dans des applications de commande de processus et d'inspection de produits. Plus particulièrement, l'invention concerne l'utilisation de systèmes d'éclairage à motifs conçus pour l'inspection de surface visuelle d'objets polis de type roulements à billes. L'utilisation de systèmes d'éclairage à motifs disposés correctement par rapport à une partie polie inspectée permet de voir des petites imperfections de surface de type éraflures et creux contre l'arrière-plan de surface normal. L'utilisation de systèmes d'éclairage soigneusement mis au point facilite la diffusion avantageuse de sites défectueux à partir de sources de champs généralement sombres. Les systèmes d'éclairage de l'invention permettent, de par leurs motifs, d'éclairer de manière efficace la surface totale des parties tridimensionnelles au moyen de champs d'éclairage sombres.