APPLICATION-SPECIFIC TESTING METHODS FOR PROGRAMMABLE LOGIC DEVICES

Disclosed are methods for utilizing programmable logic devices that contain at least one localized defect. Such devices are tested to determine their suitability for implementing selected designs that may not require the resources impacted by the defect. If the FPGA is found to be unsuitable for one...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LING, ZHI-MIN, PATRIE, ROBERT, D, TONG, VINCENT, L, CHO, JAE, WELLS, ROBERT, W, TOUTOUNCHI, SHAHIN, JOHNSON, CLAY, S, DAVIS, SHELLY, G
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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