DEVICE FOR AND METHOD OF MATERIAL ANALYSIS USING A SHUTTER COMPRISING A CALIBRATION SAMPLE

A device (1; 1a) for the examination of at least one material sample (3; 3a, 3b, 3c) which can be inserted into the device (1; 1a) and is irradiated by means of electromagnetic waves (4), notably X-rays; in the measuring position the material sample (3; 3a, 3b, 3c) can be subjected to irradiation by...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	VREBOS, BRUNO, A., R, DE LANGE, ROELOF
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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