X-ray detector with improved spatial gain uniformity and resolution and method of fabricating such X-ray detector

An X-ray detector (1) includes a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:Tl layer, a reflector layer (9) and a light emission layer (7) interposed between the scintillator layer (5) and the reflector layer (9). The light emission layer (7)...

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Hauptverfasser:	Poorter, Tiemen, Steinhauser, Heidrun, Cornelissen, Hugo Johan, Verschuren, Coen Adrianus
Format:	Patent
Sprache:	eng
Schlagworte:	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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creator	Poorter, Tiemen Steinhauser, Heidrun Cornelissen, Hugo Johan Verschuren, Coen Adrianus
description	An X-ray detector (1) includes a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:Tl layer, a reflector layer (9) and a light emission layer (7) interposed between the scintillator layer (5) and the reflector layer (9). The light emission layer (7) may include an OLED and may have a thickness of less than 50 μm. Thereby, a sensitivity and resolution of the X-ray detector may be improved.
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title	X-ray detector with improved spatial gain uniformity and resolution and method of fabricating such X-ray detector
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