X-ray detector with improved spatial gain uniformity and resolution and method of fabricating such X-ray detector

X-ray detector with improved spatial gain uniformity and resolution and method of fabricating such X-ray detector

An X-ray detector (1) includes a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:Tl layer, a reflector layer (9) and a light emission layer (7) interposed between the scintillator layer (5) and the reflector layer (9). The light emission layer (7)...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Poorter, Tiemen, Steinhauser, Heidrun, Cornelissen, Hugo Johan, Verschuren, Coen Adrianus
Format: Patent
Sprache:eng
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:An X-ray detector (1) includes a light detection arrangement (3) such as a CMOS photodetector, a scintillator layer (5) such as a CsI:Tl layer, a reflector layer (9) and a light emission layer (7) interposed between the scintillator layer (5) and the reflector layer (9). The light emission layer (7) may include an OLED and may have a thickness of less than 50 μm. Thereby, a sensitivity and resolution of the X-ray detector may be improved.