X-ray photography device

A cross section obtained by cutting an X-ray beam at a time of taking projection data from the X-ray beam detected by an X-ray sensor, with a plane, which is perpendicular to the central axis of the X-ray beam and runs through the central axis of a photographic region, is defined as a photography sp...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: Takemoto, Terumi
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A cross section obtained by cutting an X-ray beam at a time of taking projection data from the X-ray beam detected by an X-ray sensor, with a plane, which is perpendicular to the central axis of the X-ray beam and runs through the central axis of a photographic region, is defined as a photography specification surface. The number of the photography specification surface per unit area in a plane, as the photographic region is viewed from a point in the direction along the central axis of the photographic region, is defined as overlap density of the projection data. A controller of an X-ray photography device executes a leveling control which levels the overlap density of the projection data between at an outer portion and inner portion of the photographic region. Thus, an X-ray photographic device is provided that is capable of improving the image quality in the entire photographic region.