SAFT analysis of defects close to the surface

SAFT analysis of defects close to the surface

A method and device for the ultrasonic testing of test objects by means of a test head. A computer device directly acquires, during a SAFT analysis for determining points in time of the amplitudes to be summed up from among the image time signals, a propagation time, which depends on the test head,...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Mooshofer, Hubert
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:A method and device for the ultrasonic testing of test objects by means of a test head. A computer device directly acquires, during a SAFT analysis for determining points in time of the amplitudes to be summed up from among the image time signals, a propagation time, which depends on the test head, from the test head positioned at a measuring point to the location of each of a plurality of voxels and uses the propagation time for calculating an amplitude total for the plurality of voxels.