Methods and apparatus for analyzing effects of friction on process control devices

Methods and apparatus for analyzing effects of friction on process control devices are disclosed herein. An example method includes determining, by executing an instruction with at least one processor, a first value corresponding to friction associated with at least one of an actuator or a process c...

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Bibliographische Detailangaben
1. Verfasser: Anderson, Shawn William
Format: Patent
Sprache:eng
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Zusammenfassung:Methods and apparatus for analyzing effects of friction on process control devices are disclosed herein. An example method includes determining, by executing an instruction with at least one processor, a first value corresponding to friction associated with at least one of an actuator or a process control device to be operated by the actuator; determining a second value indicative of an effect of the friction on operation of the process control device via the actuator based on the first value corresponding to the friction and a first threshold value; and changing a force input to move a plug of the process control device 1) a distance or 2) a distance within a time period when the second value satisfies a second threshold value.