Test handler and circulation method of test trays in test handler

Test handler and circulation method of test trays in test handler

In accordance with an embodiment of the present invention, there is provided a circulation method of a test tray in a test handler, the method comprising: in case of a first mode of test of temperature condition, firstly circulating the test tray along a first circulation path; and in case of a seco...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Kweon, Young-Ho, Na, Yun-Sung, Noh, Jong Ki
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Beschreibung
Zusammenfassung:In accordance with an embodiment of the present invention, there is provided a circulation method of a test tray in a test handler, the method comprising: in case of a first mode of test of temperature condition, firstly circulating the test tray along a first circulation path; and in case of a second mode of test of temperature condition different from the first mode, secondly circulating the test tray along a second circulation path, wherein the first circulation path and the second circulation path are different from each other in the transfer direction of the test tray at least in some sections.