Measuring parameters of a cut gemstone

Apparatus and corresponding methods for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location. Apparatus comprise a plurality of light sources, each configured to emit light at a different one of a plurality of emission wavelengths or ranges of...

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Bibliographische Detailangaben
Hauptverfasser:	Willis, Maxwell Ralph, Davies, Nicholas Matthew, Rose, Peter Stanley, D'Gama, Siobhan
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICS POSTAL SORTING SEPARATING SOLIDS FROM SOLIDS SORTING SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTEDPIECE-MEAL, e.g. BY PICKING TESTING TRANSPORTING
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Beschreibung
Zusammenfassung:	Apparatus and corresponding methods for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location. Apparatus comprise a plurality of light sources, each configured to emit light at a different one of a plurality of emission wavelengths or ranges of wavelengths such that the emitted light illuminates at least part of the measurement location. Apparatus further comprise a sensor assembly configured to sense light at a plurality of sensing wavelengths or ranges of wavelengths for measuring the plurality of parameters. The sensed light is received at the sensor assembly from the measurement location as a result of illumination of a cut gemstone located at the measurement location.