Damage free enhancement of dopant diffusion into a substrate

A method of doping a substrate. The method may include implanting a dose of a helium species into the substrate through a surface of the substrate at an implant temperature of 300° C. or greater. The method may further include depositing a doping layer containing a dopant on the surface of the subst...

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Bibliographische Detailangaben
Hauptverfasser: Hatem, Christopher R, Rowland, Christopher A
Format: Patent
Sprache:eng
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Zusammenfassung:A method of doping a substrate. The method may include implanting a dose of a helium species into the substrate through a surface of the substrate at an implant temperature of 300° C. or greater. The method may further include depositing a doping layer containing a dopant on the surface of the substrate, and annealing the substrate at an anneal temperature, the anneal temperature being greater than the implant temperature.