Semiconductor device and test method

According to one embodiment, there is provided a semiconductor device including a temperature detection circuit and a test circuit. The temperature detection circuit is configured to detect a temperature by comparing potential of a reference block and reference potential. The test circuit is configu...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Ootuka Hirosi, Matsumoto Shuuji, Hara Makoto
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
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