Semiconductor device and test method
According to one embodiment, there is provided a semiconductor device including a temperature detection circuit and a test circuit. The temperature detection circuit is configured to detect a temperature by comparing potential of a reference block and reference potential. The test circuit is configu...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | According to one embodiment, there is provided a semiconductor device including a temperature detection circuit and a test circuit. The temperature detection circuit is configured to detect a temperature by comparing potential of a reference block and reference potential. The test circuit is configured to test, in a test mode, an operation of the temperature detection circuit by serially switching a value of the reference potential to a value selected from a plurality of values, which is different from each other, while a temperature of the semiconductor device is kept at a first temperature. |
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