Methods for designing a layout of a semiconductor device including at least one risk via

A method of designing a layout of a semiconductor device includes preparing a layout for a semiconductor integrated circuit, the preparing of the layout including providing lower and upper metal patterns and via patterns, which are vertically interposed between the lower and upper metal patterns, pe...

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Hauptverfasser: Paek Seung Weon, Kim Byung-Moo
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creator Paek Seung Weon
Kim Byung-Moo
description A method of designing a layout of a semiconductor device includes preparing a layout for a semiconductor integrated circuit, the preparing of the layout including providing lower and upper metal patterns and via patterns, which are vertically interposed between the lower and upper metal patterns, performing a retargeting process on the lower and upper metal patterns, classifying the via patterns to extract at least one risk via from the via patterns and changing a position of the risk via. During the changing of the position of the risk via, all of the via patterns, other than the risk via, are unchanged in position thereof. Related systems and computer program products are disclosed.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9904753B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9904753B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9904753B23</originalsourceid><addsrcrecordid>eNqNyjEKwkAQQNE0FqLeYS4giFEkraLYWKlgF4bd2Ti4zoTMbsDbG4IHsPq_eNPicaH0VG8QtANPxo2wNIAQ8aM5gYbhjd7sVHx2aVQ9OwIWF7MfcYJIaAMWgo7tBT3jvJgEjEaLX2cFnI63w3lJrdZkLToSSvX9WlWrzW5b7tflH-QLAzE5uA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Methods for designing a layout of a semiconductor device including at least one risk via</title><source>esp@cenet</source><creator>Paek Seung Weon ; Kim Byung-Moo</creator><creatorcontrib>Paek Seung Weon ; Kim Byung-Moo</creatorcontrib><description>A method of designing a layout of a semiconductor device includes preparing a layout for a semiconductor integrated circuit, the preparing of the layout including providing lower and upper metal patterns and via patterns, which are vertically interposed between the lower and upper metal patterns, performing a retargeting process on the lower and upper metal patterns, classifying the via patterns to extract at least one risk via from the via patterns and changing a position of the risk via. During the changing of the position of the risk via, all of the via patterns, other than the risk via, are unchanged in position thereof. Related systems and computer program products are disclosed.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180227&amp;DB=EPODOC&amp;CC=US&amp;NR=9904753B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180227&amp;DB=EPODOC&amp;CC=US&amp;NR=9904753B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Paek Seung Weon</creatorcontrib><creatorcontrib>Kim Byung-Moo</creatorcontrib><title>Methods for designing a layout of a semiconductor device including at least one risk via</title><description>A method of designing a layout of a semiconductor device includes preparing a layout for a semiconductor integrated circuit, the preparing of the layout including providing lower and upper metal patterns and via patterns, which are vertically interposed between the lower and upper metal patterns, performing a retargeting process on the lower and upper metal patterns, classifying the via patterns to extract at least one risk via from the via patterns and changing a position of the risk via. During the changing of the position of the risk via, all of the via patterns, other than the risk via, are unchanged in position thereof. Related systems and computer program products are disclosed.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEKwkAQQNE0FqLeYS4giFEkraLYWKlgF4bd2Ti4zoTMbsDbG4IHsPq_eNPicaH0VG8QtANPxo2wNIAQ8aM5gYbhjd7sVHx2aVQ9OwIWF7MfcYJIaAMWgo7tBT3jvJgEjEaLX2cFnI63w3lJrdZkLToSSvX9WlWrzW5b7tflH-QLAzE5uA</recordid><startdate>20180227</startdate><enddate>20180227</enddate><creator>Paek Seung Weon</creator><creator>Kim Byung-Moo</creator><scope>EVB</scope></search><sort><creationdate>20180227</creationdate><title>Methods for designing a layout of a semiconductor device including at least one risk via</title><author>Paek Seung Weon ; Kim Byung-Moo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9904753B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>Paek Seung Weon</creatorcontrib><creatorcontrib>Kim Byung-Moo</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Paek Seung Weon</au><au>Kim Byung-Moo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Methods for designing a layout of a semiconductor device including at least one risk via</title><date>2018-02-27</date><risdate>2018</risdate><abstract>A method of designing a layout of a semiconductor device includes preparing a layout for a semiconductor integrated circuit, the preparing of the layout including providing lower and upper metal patterns and via patterns, which are vertically interposed between the lower and upper metal patterns, performing a retargeting process on the lower and upper metal patterns, classifying the via patterns to extract at least one risk via from the via patterns and changing a position of the risk via. During the changing of the position of the risk via, all of the via patterns, other than the risk via, are unchanged in position thereof. Related systems and computer program products are disclosed.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
PHYSICS
SEMICONDUCTOR DEVICES
title Methods for designing a layout of a semiconductor device including at least one risk via
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T07%3A03%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Paek%20Seung%20Weon&rft.date=2018-02-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9904753B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true