Automatic analyzer

Disclosed is an automatic analyzer that analyzes a component of a target layer of a test sample separated into a plurality of layers by transferring the component from an installed container, including: a dispensing probe that descends into the target layer and suctions the component; a detecting unit that detects the height of the layer surface of the target layer of the test sample; a calculating unit that calculates the depth from the layer surface of the target layer at which the total content of the component of the target layer reaches a target amount; and a controller that causes the dispensing probe to descend to the depth calculated by the calculating unit and suction the component.