Standing wave interferometric microscope

A wide-field interferometric microscope comprising: - A specimen holder, for holding a specimen at an analysis location; - An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; - A pair of projection systems, arranged at opposite sides of s...

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Hauptverfasser: Daum Rainer, Voegele Xaver
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A wide-field interferometric microscope comprising: - A specimen holder, for holding a specimen at an analysis location; - An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; - A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere; - A detector arrangement, for examining output light from said combining element, wherein: - The illuminator is configured to produce a standing wave of input radiation at the analysis location - The detector arrangement comprises exactly two interferometric detection branches.