Adapter tip and microscope system for inspection of fiber-optic connector endface

There is provided an adapter tip to be employed with an optical-fiber inspection microscope probe and an optical-fiber inspection microscope system suitable for imaging the optical-fiber endface of an angled-polished optical-fiber connector deeply recessed within a connector adapter. The adapter tip...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Morin-Drouin Etienne, Baribault Robert
Format:	Patent
Sprache:	eng
Schlagworte:	BLASTING FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMSTHEREOF HEATING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LIGHTING MEASURING MECHANICAL ENGINEERING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHERARTICLES, NOT OTHERWISE PROVIDED FOR TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR WEAPONS
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Beschreibung
Zusammenfassung:	There is provided an adapter tip to be employed with an optical-fiber inspection microscope probe and an optical-fiber inspection microscope system suitable for imaging the optical-fiber endface of an angled-polished optical-fiber connector deeply recessed within a connector adapter. The adapter tip or microscope system comprises a relay lens system having at least a first relay lens which is disposed so as to directly receive light reflected from the optical-fiber endface during inspection, the lens axis of the first relay lens being offset relative to the optical-fiber endface so as to deviate light reflected from the optical-fiber endface towards the optical-fiber axis of the connector.