Multi-path interferometeric sensor

A multi-path interferometric sensor for sensing small changes in the refractive index of sensing arms thereof, such as caused by the presence of an analyte or changes in analyte concentration, is disclosed. The sensor includes a single light source, a single detector, and a plurality of interferomet...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Schreuder Frederik, Heideman Rene Gerrit
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A multi-path interferometric sensor for sensing small changes in the refractive index of sensing arms thereof, such as caused by the presence of an analyte or changes in analyte concentration, is disclosed. The sensor includes a single light source, a single detector, and a plurality of interferometers or a single multi-path interferometer. The various sensing branches within the multi-path interferometric sensor each include a delay having a different length. This results in a different modulation frequency for each interferometer, each of carriers include phase information that correlates to a change in refractive index and, ultimately, analyte concentration. The plural carrier frequencies enable simultaneous detection of multiple samples.