Method of forming aligned pattern in pattern formation region by using imprint process

A method of forming a pattern by using an imprint process includes: forming an adhesion promoting layer only in a pattern formation region on a substrate; coating a resin to cover the substrate and the adhesion promoting layer; transferring a pattern of a stamp mold to the resin covering the substra...

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Bibliographische Detailangaben
Hauptverfasser: Bae Jihyun, Lee Sunghoon, Yoon Ilsun, Hahm Sukgyu, Kim Dongouk, Chung Jaeseung, Park Joonyong, Shin Bongsu, Ok Jong G
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A method of forming a pattern by using an imprint process includes: forming an adhesion promoting layer only in a pattern formation region on a substrate; coating a resin to cover the substrate and the adhesion promoting layer; transferring a pattern of a stamp mold to the resin covering the substrate and the adhesion promoting layer, by pressing the stamp mold onto the resin; irradiating ultraviolet light onto the resin covering the substrate and the adhesion promoting layer, to cure the resin and form a pattern of the cured resin to correspond to the pattern of the stamp mold, on the substrate; and detaching the stamp mold from the substrate, to leave a portion of the cured resin pattern only on the adhesion promoting layer on the substrate and to remove a remaining portion of the cured resin pattern from the substrate.