MEMS sensor filtering with error feedback

Systems and methods for filtering a micro-electromechanical system sensor rate signal with error feedback are provided. In one example, a micro-electromechanical system sensor rate signal is provided. Next, a feedback signal from a feedback loop is subtracted from the micro-electromechanical system...

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Bibliographische Detailangaben
1. Verfasser:	Henrickson Jens M
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS GYROSCOPIC INSTRUMENTS INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT MEASURING MEASURING DISTANCES, LEVELS OR BEARINGS MEASURING ELECTRIC VARIABLES MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION,OR SHOCK MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR NAVIGATION PHOTOGRAMMETRY OR VIDEOGRAMMETRY PHYSICS SURVEYING TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	Systems and methods for filtering a micro-electromechanical system sensor rate signal with error feedback are provided. In one example, a micro-electromechanical system sensor rate signal is provided. Next, a feedback signal from a feedback loop is subtracted from the micro-electromechanical system sensor rate signal to produce a first combined signal. The first combined signal is then filtered to produce a filtered rate output. The micro-electromechanical system sensor rate signal is then subtracted from the filtered rate output to produce an error signal, wherein the error signal is used in the feedback loop to generate a feedback signal for a future time step.