Hemispherical scanning optical scatterometer

A hemispherical scanning optical scatterometer and method for its use for measuring scattered radiation, with a reflected scatter measurement laser, and/or a transmitted scatter measurement laser, an array of optical detectors, a computer controlled system to rotate the array of optical detectors, a...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Stover John Clyde, Hegstrom Eric Loren
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A hemispherical scanning optical scatterometer and method for its use for measuring scattered radiation, with a reflected scatter measurement laser, and/or a transmitted scatter measurement laser, an array of optical detectors, a computer controlled system to rotate the array of optical detectors, an electronic system, a computer interface and a computer for processing the signal.