Electronic gage apparatus

A gage apparatus includes a probe, a processor, and a memory. The probe includes a plurality of transmitters and a plurality of receivers both aligned in an axial direction along the probe. The processor is in electronic communication with the plurality of transmitters and the plurality of receivers...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	Bumgardner Mark D, Gorsh Christopher M, Schweiger Jonathan A
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CONVEYING HANDLING THIN OR FILAMENTARY MATERIAL HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS,CABLES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PACKING PERFORMING OPERATIONS PHYSICS STORING TARIFF METERING APPARATUS TESTING TRANSPORTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A gage apparatus includes a probe, a processor, and a memory. The probe includes a plurality of transmitters and a plurality of receivers both aligned in an axial direction along the probe. The processor is in electronic communication with the plurality of transmitters and the plurality of receivers. The memory is in electronic communication with the processor. The memory includes programming code for execution by the processor. The programming code is configured to determine a length of a structure disposed adjacent to the probe based on which of the plurality of receivers receive signals transmitted by the plurality of transmitters and reflected off the structure.