Method and structure for gap filling improvement

The present disclosure provides a method for forming a semiconductor structure. The method includes providing a substrate including a plurality of fin structures on the substrate; coating a first solution on the substrate to form a first dielectric layer; and coating a second solution on the first d...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Chang Chi-Kang, Chen Kuei-Shun, Su Yu-Chung, Liu Chia-Chu, Liu Yu-Lun, Su Ying-Hao
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:The present disclosure provides a method for forming a semiconductor structure. The method includes providing a substrate including a plurality of fin structures on the substrate; coating a first solution on the substrate to form a first dielectric layer; and coating a second solution on the first dielectric layer to form a second dielectric layer to cover the fin structures. The first solution has a first viscosity. The second solution has a second viscosity. In some embodiments, the second viscosity is greater than the first viscosity.