Method for testing a latching magnet of a switch and test device for the latching magnet

A method is disclosed for testing a latching magnet of a switch including a switching contact, formed from contact elements mechanically separated from one another for opening the switching contact; an electronic trip unit, to monitor current flowing via the contact elements and to perform a test for a current-dependent trip condition; an electrical energy store, forming a circuit with the winding of the latching magnet, the circuit being closed for a first closing time when the trip condition of the trip unit is met; and an actuator, actuable by closing off the circuit and configured to separate the contact elements. For test purposes, the circuit is closed for a second closing time, which is so short that separation of the contact elements by the actuator does not take place. A test is then performed to ascertain whether there is a current flowing via the winding of the latching magnet.