Non-volatile memory with in field failure prediction using leakage detection

To prevent data loss due to latent defects, a non-volatile memory system will use a leakage detection circuit to test for small amounts of leakage that indicate that the memory is susceptible to failure.

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Bibliographische Detailangaben
Hauptverfasser:	Peesari Srikar, Ghai Ashish, Vakati Kalpana, Uthayopas Maythin, Krishnamoorthy Yuvaraj, Singh Ekamdeep, Shlick Mark
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES
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Beschreibung
Zusammenfassung:	To prevent data loss due to latent defects, a non-volatile memory system will use a leakage detection circuit to test for small amounts of leakage that indicate that the memory is susceptible to failure.