Smart handler resource distribution system

A system for concurrently testing multiple semiconductor components includes multiple testers, each including a processor and a memory configured to store and execute control signals for completing testing of one of the semiconductor components, a tester side docking board, and a tester communication port. A handler has multiple test sites, each of which is configured to receive one of the semiconductor components, a handler side docking board, and a handler communication port. A controller is located externally from the testers and the handler and is in communication with each of the testers and the handler through the tester and handler communication ports. Communication between each of the testers and the handler occurs through the controller, and each of the testers is connected, via the tester side docking board, to a corresponding one of the semiconductor components through the handler side docking board.