Image sensor isolation region and method of forming the same

Image sensors comprising an isolation region according to embodiments are disclosed, as well as methods of forming the image sensors with isolation region. An embodiment is a structure comprising a semiconductor substrate, a photo element in the semiconductor substrate, and an isolation region in th...

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Bibliographische Detailangaben
Hauptverfasser: JangJian Shiu-Ko, Hong Min Hao, Chen Kei-Wei, Wu Szu-An
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Image sensors comprising an isolation region according to embodiments are disclosed, as well as methods of forming the image sensors with isolation region. An embodiment is a structure comprising a semiconductor substrate, a photo element in the semiconductor substrate, and an isolation region in the semiconductor substrate. The isolation region is proximate the photo element and comprises a dielectric material and an epitaxial region. The epitaxial region is disposed between the semiconductor substrate and the dielectric material.