Method for testing tunable wavelength laser device and tunable wavelength laser device

A method for testing a tunable wavelength laser device, which can suppress any error of light transmission characteristics of an etalon, and a tunable wavelength laser device are provided. The method for testing a tunable wavelength laser device is a method for testing a tunable wavelength laser dev...

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1. Verfasser: Banno Eiichi
Format: Patent
Sprache:eng
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Zusammenfassung:A method for testing a tunable wavelength laser device, which can suppress any error of light transmission characteristics of an etalon, and a tunable wavelength laser device are provided. The method for testing a tunable wavelength laser device is a method for testing a tunable wavelength laser device including a tunable wavelength laser and a wavelength sensing unit having an etalon. The testing method includes a first step of measuring a free spectral range interval of the etalon, a second step of acquiring a driving condition by tuning a wavelength to a target value provided between a top and a bottom of the free spectral range interval, and a third step of storing the driving condition in a memory.