Testing memory devices with parallel processing operations

An ATE system performs RA over NAND flash memory DUTs. A first UBM captures fresh failure related data from a DUT. A second UBM transmits existing failure related data. A fail engine accesses the stored existing failure related data and generates a failure list based thereon. The storing and the accessing the existing failure related data, and/or the generating the failure list, are performed in parallel contemporaneously in relation to the capturing the fresh data. The generated failure list is queued. A failure processor, which may be operable for controlling the capturing, computes a redundancy analysis based on the queued failure list. The first and second UBMs then ping-pong operably.