Integrated circuit chip with corrected temperature drift

Integrated circuit chip with corrected temperature drift

An integrated circuit chip includes trenches at least partially surrounding a critical portion of a circuit that is sensitive to temperature variations. The trenches are locally interrupted in order to permit circuit connections to pass between the critical portion and an outer portion containing a...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Maige Philippe, Pontarollo Serge
Format: Patent
Sprache:eng
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:An integrated circuit chip includes trenches at least partially surrounding a critical portion of a circuit that is sensitive to temperature variations. The trenches are locally interrupted in order to permit circuit connections to pass between the critical portion and an outer portion containing a remainder of the circuit. The critical portion includes heating resistors and a temperature sensor.