Measurement apparatus and method of measurement

A measurement apparatus includes a measuring unit that carries out a potential measuring process that measures potential at measured positions on a surface of a laminated body, in which a plurality of plate-like or film-like component parts with different physical properties have been laminated, in...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	Kawamuro Yuki, Handa Nobuhisa, Takahashi Tetsuya
Format:	Patent
Sprache:	eng
Schlagworte:	APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY BEER BIOCHEMISTRY CHEMISTRY ENZYMOLOGY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES METALLURGY MICROBIOLOGY MUTATION OR GENETIC ENGINEERING PHYSICS SPIRITS TESTING VINEGAR WINE
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Beschreibung
Zusammenfassung:	A measurement apparatus includes a measuring unit that carries out a potential measuring process that measures potential at measured positions on a surface of a laminated body, in which a plurality of plate-like or film-like component parts with different physical properties have been laminated, in a state where an electrical signal has been supplied to the surface, and a processing unit that carries out a computational process, which has been decided in advance, using measurement values of the potential that have been measured by the potential measuring process to find an interfacial resistance of an interface between the component parts in the laminated body.