Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age
A data retention methodology for use in electrically rewritable nonvolatile storage systems is disclosed. The methodology collects characteristic data of the storage system (e.g., time stamps, program/erase cycles, sensed temperature over time, and others) and uses at least a portion of that data to...
Gespeichert in:
| Hauptverfasser: | , , , , , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Walls Andrew D Simmons Lincoln T Fry Aaron D Excoffier Franck Tressler Gary A Chunn Adam C |
| description | A data retention methodology for use in electrically rewritable nonvolatile storage systems is disclosed. The methodology collects characteristic data of the storage system (e.g., time stamps, program/erase cycles, sensed temperature over time, and others) and uses at least a portion of that data to associate various data retention schemes with the collected characteristic data. At power-on, the methodology determines a duration of a time during which power was not supplied to the storage system. The methodology also uses the power-on time to trigger the selection of an appropriate data protection scheme (e.g., enhanced ECC and/or read/scrub frequency). Dynamic selection and adjustment of the applied protection scheme may be based on the predetermined and/or calculated association between various protection schemes and the collected characteristic data of the storage system. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9571128B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9571128B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9571128B23</originalsourceid><addsrcrecordid>eNqNjDsOwkAQQ9NQIOAOcwAoEoSAlp_ogRoNG4cEZT_amQil4O4sUg5AZdl6fuPsc-gd28YQl69O1MIp-YpKVqYQvcJo4x2JqWEh1DiqWpaaRH3kJ0h6UVihBwtKSmRqAZG1i5hT8G_E5EvCLm0_E7tyUKT7NBtV3ApmQ04yOh2v-_MCwd8hgQ0c9H67bFfrPC82u2L5B_IF3R5H_g</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age</title><source>esp@cenet</source><creator>Walls Andrew D ; Simmons Lincoln T ; Fry Aaron D ; Excoffier Franck ; Tressler Gary A ; Chunn Adam C</creator><creatorcontrib>Walls Andrew D ; Simmons Lincoln T ; Fry Aaron D ; Excoffier Franck ; Tressler Gary A ; Chunn Adam C</creatorcontrib><description>A data retention methodology for use in electrically rewritable nonvolatile storage systems is disclosed. The methodology collects characteristic data of the storage system (e.g., time stamps, program/erase cycles, sensed temperature over time, and others) and uses at least a portion of that data to associate various data retention schemes with the collected characteristic data. At power-on, the methodology determines a duration of a time during which power was not supplied to the storage system. The methodology also uses the power-on time to trigger the selection of an appropriate data protection scheme (e.g., enhanced ECC and/or read/scrub frequency). Dynamic selection and adjustment of the applied protection scheme may be based on the predetermined and/or calculated association between various protection schemes and the collected characteristic data of the storage system.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CALCULATING ; CODE CONVERSION IN GENERAL ; CODING ; COMPUTING ; COUNTING ; DECODING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; INFORMATION STORAGE ; PHYSICS ; STATIC STORES</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170214&DB=EPODOC&CC=US&NR=9571128B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20170214&DB=EPODOC&CC=US&NR=9571128B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Walls Andrew D</creatorcontrib><creatorcontrib>Simmons Lincoln T</creatorcontrib><creatorcontrib>Fry Aaron D</creatorcontrib><creatorcontrib>Excoffier Franck</creatorcontrib><creatorcontrib>Tressler Gary A</creatorcontrib><creatorcontrib>Chunn Adam C</creatorcontrib><title>Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age</title><description>A data retention methodology for use in electrically rewritable nonvolatile storage systems is disclosed. The methodology collects characteristic data of the storage system (e.g., time stamps, program/erase cycles, sensed temperature over time, and others) and uses at least a portion of that data to associate various data retention schemes with the collected characteristic data. At power-on, the methodology determines a duration of a time during which power was not supplied to the storage system. The methodology also uses the power-on time to trigger the selection of an appropriate data protection scheme (e.g., enhanced ECC and/or read/scrub frequency). Dynamic selection and adjustment of the applied protection scheme may be based on the predetermined and/or calculated association between various protection schemes and the collected characteristic data of the storage system.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CALCULATING</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DECODING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>INFORMATION STORAGE</subject><subject>PHYSICS</subject><subject>STATIC STORES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjDsOwkAQQ9NQIOAOcwAoEoSAlp_ogRoNG4cEZT_amQil4O4sUg5AZdl6fuPsc-gd28YQl69O1MIp-YpKVqYQvcJo4x2JqWEh1DiqWpaaRH3kJ0h6UVihBwtKSmRqAZG1i5hT8G_E5EvCLm0_E7tyUKT7NBtV3ApmQ04yOh2v-_MCwd8hgQ0c9H67bFfrPC82u2L5B_IF3R5H_g</recordid><startdate>20170214</startdate><enddate>20170214</enddate><creator>Walls Andrew D</creator><creator>Simmons Lincoln T</creator><creator>Fry Aaron D</creator><creator>Excoffier Franck</creator><creator>Tressler Gary A</creator><creator>Chunn Adam C</creator><scope>EVB</scope></search><sort><creationdate>20170214</creationdate><title>Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age</title><author>Walls Andrew D ; Simmons Lincoln T ; Fry Aaron D ; Excoffier Franck ; Tressler Gary A ; Chunn Adam C</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9571128B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2017</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CALCULATING</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DECODING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>INFORMATION STORAGE</topic><topic>PHYSICS</topic><topic>STATIC STORES</topic><toplevel>online_resources</toplevel><creatorcontrib>Walls Andrew D</creatorcontrib><creatorcontrib>Simmons Lincoln T</creatorcontrib><creatorcontrib>Fry Aaron D</creatorcontrib><creatorcontrib>Excoffier Franck</creatorcontrib><creatorcontrib>Tressler Gary A</creatorcontrib><creatorcontrib>Chunn Adam C</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Walls Andrew D</au><au>Simmons Lincoln T</au><au>Fry Aaron D</au><au>Excoffier Franck</au><au>Tressler Gary A</au><au>Chunn Adam C</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age</title><date>2017-02-14</date><risdate>2017</risdate><abstract>A data retention methodology for use in electrically rewritable nonvolatile storage systems is disclosed. The methodology collects characteristic data of the storage system (e.g., time stamps, program/erase cycles, sensed temperature over time, and others) and uses at least a portion of that data to associate various data retention schemes with the collected characteristic data. At power-on, the methodology determines a duration of a time during which power was not supplied to the storage system. The methodology also uses the power-on time to trigger the selection of an appropriate data protection scheme (e.g., enhanced ECC and/or read/scrub frequency). Dynamic selection and adjustment of the applied protection scheme may be based on the predetermined and/or calculated association between various protection schemes and the collected characteristic data of the storage system.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US9571128B2 |
| source | esp@cenet |
| subjects | BASIC ELECTRONIC CIRCUITRY CALCULATING CODE CONVERSION IN GENERAL CODING COMPUTING COUNTING DECODING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY INFORMATION STORAGE PHYSICS STATIC STORES |
| title | Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T07%3A14%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Walls%20Andrew%20D&rft.date=2017-02-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9571128B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |