Dynamic adjustment of data protection schemes in flash storage systems based on temperature, power off duration and flash age

A data retention methodology for use in electrically rewritable nonvolatile storage systems is disclosed. The methodology collects characteristic data of the storage system (e.g., time stamps, program/erase cycles, sensed temperature over time, and others) and uses at least a portion of that data to associate various data retention schemes with the collected characteristic data. At power-on, the methodology determines a duration of a time during which power was not supplied to the storage system. The methodology also uses the power-on time to trigger the selection of an appropriate data protection scheme (e.g., enhanced ECC and/or read/scrub frequency). Dynamic selection and adjustment of the applied protection scheme may be based on the predetermined and/or calculated association between various protection schemes and the collected characteristic data of the storage system.