Apparatus and methods for treating a substrate

A substrate treatment apparatus is provided. The apparatus may include a process chamber configured to have an internal space, a substrate supporting member disposed in the process chamber to support a substrate, a first supplying port configured to supply a supercritical fluid to a region of the in...

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Bibliographische Detailangaben
Hauptverfasser: Kim SeokHoon, Jun Yongmyung, Lee Kuntack, Lee Hyosan, Ko Yongsun, Kim Kwangsu, Kim Kyongseob, Cho Yong-Jhin
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:A substrate treatment apparatus is provided. The apparatus may include a process chamber configured to have an internal space, a substrate supporting member disposed in the process chamber to support a substrate, a first supplying port configured to supply a supercritical fluid to a region of the internal space located below the substrate, a second supplying port configured to supply a supercritical fluid to other region of the internal space located over the substrate, and an exhaust port configured to exhaust the supercritical fluid from the process chamber to an exterior region.