Testing a multi-phase voltage regulator module

Testing a multi-phase voltage regulator module

Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Swenson Eric B, Coq Marc, Fishbune Richard J, Bulur Yakup
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Swenson Eric B
Coq Marc
Fishbune Richard J
Bulur Yakup
description Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance pins. The output signal of the multi-phase VRM is monitored in response to the induced failure condition.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9529058B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9529058B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9529058B23</originalsourceid><addsrcrecordid>eNrjZNALSS0uycxLV0hUyC3NKcnULchILE5VKMvPKUlMT1UoSk0vzUksyS9SyM1PKc1J5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBlqZGlgamFk5GxkQoAQC4-SqI</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Testing a multi-phase voltage regulator module</title><source>esp@cenet</source><creator>Swenson Eric B ; Coq Marc ; Fishbune Richard J ; Bulur Yakup</creator><creatorcontrib>Swenson Eric B ; Coq Marc ; Fishbune Richard J ; Bulur Yakup</creatorcontrib><description>Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance pins. The output signal of the multi-phase VRM is monitored in response to the induced failure condition.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161227&amp;DB=EPODOC&amp;CC=US&amp;NR=9529058B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20161227&amp;DB=EPODOC&amp;CC=US&amp;NR=9529058B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Swenson Eric B</creatorcontrib><creatorcontrib>Coq Marc</creatorcontrib><creatorcontrib>Fishbune Richard J</creatorcontrib><creatorcontrib>Bulur Yakup</creatorcontrib><title>Testing a multi-phase voltage regulator module</title><description>Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance pins. The output signal of the multi-phase VRM is monitored in response to the induced failure condition.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNALSS0uycxLV0hUyC3NKcnULchILE5VKMvPKUlMT1UoSk0vzUksyS9SyM1PKc1J5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8aHBlqZGlgamFk5GxkQoAQC4-SqI</recordid><startdate>20161227</startdate><enddate>20161227</enddate><creator>Swenson Eric B</creator><creator>Coq Marc</creator><creator>Fishbune Richard J</creator><creator>Bulur Yakup</creator><scope>EVB</scope></search><sort><creationdate>20161227</creationdate><title>Testing a multi-phase voltage regulator module</title><author>Swenson Eric B ; Coq Marc ; Fishbune Richard J ; Bulur Yakup</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9529058B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Swenson Eric B</creatorcontrib><creatorcontrib>Coq Marc</creatorcontrib><creatorcontrib>Fishbune Richard J</creatorcontrib><creatorcontrib>Bulur Yakup</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Swenson Eric B</au><au>Coq Marc</au><au>Fishbune Richard J</au><au>Bulur Yakup</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Testing a multi-phase voltage regulator module</title><date>2016-12-27</date><risdate>2016</risdate><abstract>Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance pins. The output signal of the multi-phase VRM is monitored in response to the induced failure condition.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US9529058B2
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Testing a multi-phase voltage regulator module
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T15%3A32%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Swenson%20Eric%20B&rft.date=2016-12-27&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9529058B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true