Testing a multi-phase voltage regulator module

Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance...

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Bibliographische Detailangaben
Hauptverfasser:	Swenson Eric B, Coq Marc, Fishbune Richard J, Bulur Yakup
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance pins. The output signal of the multi-phase VRM is monitored in response to the induced failure condition.