System and method for acquiring electrical measurements of an electronic device

Provided is a method and an apparatus for acquiring electrical measurements of an electronic device. The method and the apparatus comprise securing an elastomeric connector at least partially inside a cavity within a truncated front end of an electrical probe, wherein the electrical probe is physically and electrically coupled to an electric cable; physically and electrically coupling the electric cable to a data processor; electrically connecting the elastomeric connector end to said electronic device; and outputting electrical measurement data from the elastomeric connector end through the electric cable to said data processor. The advantages are that the connection can be single wire per probe or two wires per probe, with only a single physical connection required, and the lack of probe damage to the feature being probed.