Control system and method for sensor management

The invention relates to a measuring circuit comprising a control block for controlling said circuit, a time base for providing a clock signal (fclk) in order to time said circuit, a sensor block which is designed to provide an output signal, said measuring circuit comprising in addition a first cou...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser:	Novac Pinchas
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The invention relates to a measuring circuit comprising a control block for controlling said circuit, a time base for providing a clock signal (fclk) in order to time said circuit, a sensor block which is designed to provide an output signal, said measuring circuit comprising in addition a first counting block which is timed to the clock frequency and a second counting block which is timed by the frequency of the output signal of the sensor block.