Integrated circuit
Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for test...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | Bittlestone Clive David |
| description | Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for testing at least one of the microprocessor and memory is loadable onto the reconfigurable logic. At least one other program is loadable into the reconfigurable logic after the first test program runs. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US9482718B2</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US9482718B2</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US9482718B23</originalsourceid><addsrcrecordid>eNrjZBDyzCtJTS9KLElNUUjOLEouzSzhYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocGWJhZG5oYWTkbGRCgBAM2JH_M</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Integrated circuit</title><source>esp@cenet</source><creator>Bittlestone Clive David</creator><creatorcontrib>Bittlestone Clive David</creatorcontrib><description>Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for testing at least one of the microprocessor and memory is loadable onto the reconfigurable logic. At least one other program is loadable into the reconfigurable logic after the first test program runs.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161101&DB=EPODOC&CC=US&NR=9482718B2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76418</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20161101&DB=EPODOC&CC=US&NR=9482718B2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bittlestone Clive David</creatorcontrib><title>Integrated circuit</title><description>Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for testing at least one of the microprocessor and memory is loadable onto the reconfigurable logic. At least one other program is loadable into the reconfigurable logic after the first test program runs.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBDyzCtJTS9KLElNUUjOLEouzSzhYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxocGWJhZG5oYWTkbGRCgBAM2JH_M</recordid><startdate>20161101</startdate><enddate>20161101</enddate><creator>Bittlestone Clive David</creator><scope>EVB</scope></search><sort><creationdate>20161101</creationdate><title>Integrated circuit</title><author>Bittlestone Clive David</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US9482718B23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2016</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bittlestone Clive David</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bittlestone Clive David</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Integrated circuit</title><date>2016-11-01</date><risdate>2016</risdate><abstract>Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for testing at least one of the microprocessor and memory is loadable onto the reconfigurable logic. At least one other program is loadable into the reconfigurable logic after the first test program runs.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US9482718B2 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | Integrated circuit |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T04%3A35%3A20IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Bittlestone%20Clive%20David&rft.date=2016-11-01&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS9482718B2%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |