Integrated circuit

Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for test...

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Bibliographische Detailangaben
1. Verfasser: Bittlestone Clive David
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:Integrated circuits and methods for testing integrated circuits are disclosed herein. An embodiment of an integrated circuit includes a microprocessor and memory that is accessible by the microprocessor. The integrated circuit also includes reconfigurable logic, wherein a first test program for testing at least one of the microprocessor and memory is loadable onto the reconfigurable logic. At least one other program is loadable into the reconfigurable logic after the first test program runs.