Phase shifter chip radio frequency self-test

The method includes selecting, by control hardware, a first output from a phased locked loop, sending, by the control hardware, the first output from the phased locked loop to a first device under test and a second device under test, and adjusting, by the control hardware, a first phase rotator connected to the first device under test to a first rotator phase value of zero; determining a collection of phase detector values of a phase detector connected to the second device under test by adjusting a second phase rotator connected to the second device under test to sweep through a phase range and measuring the phase detector values of the phase detector; determining a phase detector gain of the phase detector by averaging the collection of phase detector values and storing, by the control hardware, the phase detector gain in memory hardware.