X-ray detector
The invention relates to a matrix device for measuring characteristics of an X-ray beam. The device includes a first set of detection cells of a size different from the cells of at least one second set of detection cells. Each cell corresponds to an ionization chamber including a detection electrode...
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| Format: | Patent |
| Sprache: | eng |
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| Zusammenfassung: | The invention relates to a matrix device for measuring characteristics of an X-ray beam. The device includes a first set of detection cells of a size different from the cells of at least one second set of detection cells. Each cell corresponds to an ionization chamber including a detection electrode. The detection electrodes of all the cells have the same effective surface for collecting charges. |
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