Methods for fabricating dual damascene structures in low temperature dielectric materials

Methods for fabricating dual damascene structures are provided herein. In some embodiments, a method for fabricating a dual damascene interconnect structure may include patterning a first mask layer atop a substrate disposed in a process chamber, wherein the substrate includes one or more low temperature dielectric layers to define a first etch pattern, and wherein the one or more low temperature dielectric layers are formed atop the substrate at a temperature below about 180 degrees Celsius; etching the first etch pattern into the one or more low temperature dielectric layers; patterning a second mask layer atop the substrate to define a second etch pattern, wherein the first etch pattern and the second etch pattern are aligned; and etching the second etch pattern into the one or more low temperature dielectric layers to form a dual damascene pattern in the substrate.