Device for estimating a lifetime of a secondary battery and method thereof

Device for estimating a lifetime of a secondary battery and method thereof

Embodiments of the present invention provide an accelerated lifetime estimation device for predicting the lifetime of a secondary battery, and a method thereof. The accelerated lifetime estimation device can accurately estimate a normal lifetime of the secondary battery while reducing an evaluation...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: PARK CHEOL HO, CHEONG KYEONG-BEOM, LEE JANG-WOO, SUH SEUNG BUM, BAEG KWANGKI, KIM WONSEOK, KIM YONGSIC, YANG SEUNG HO, BAEK HOYUL, KIM JONGMAN, JOUNG BOUNGGUN, SONG JOO HAN, LEE SU DONG, CHAI HEEKWAN, SHIN JEONGSOON, KO YOUNGHWA, KIM JAKE, JUNG INHO
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Embodiments of the present invention provide an accelerated lifetime estimation device for predicting the lifetime of a secondary battery, and a method thereof. The accelerated lifetime estimation device can accurately estimate a normal lifetime of the secondary battery while reducing an evaluation time period of the secondary battery.