Saw mode-based surface defect system/method

Saw mode-based surface defect system/method

Various approaches for assessing a part for a defect are disclosed and that are based upon SAW modes. In one embodiment, a part-under-test (120) is excited. One or more SAW modes (206) are identified in the frequency response (240/260) of the part-under-test (120). A SAW mode area (248/266) in the f...

Ausführliche Beschreibung

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Bibliographische Detailangaben
1. Verfasser: JAURIQUI LEANNE
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:Various approaches for assessing a part for a defect are disclosed and that are based upon SAW modes. In one embodiment, a part-under-test (120) is excited. One or more SAW modes (206) are identified in the frequency response (240/260) of the part-under-test (120). A SAW mode area (248/266) in the frequency response of the part-under-test (120) is compared with a baseline SAW mode area (238/258) of a baseline frequency response (230/250) (and which may be associated with an acceptable part). This comparison may be used to determine if the part-under-test (120) may be characterized defective in at least some respect.