Method of stack patterning using a ion etching

The embodiments disclose a method of stack patterning, including loading a stack into a stationary stack stage, rotating one or more ion beam grid assemblies substantially concentrically aligned with the stationary stack stage to etch the stack and controlling the operation of the one or more ion be...

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Bibliographische Detailangaben
Hauptverfasser: HWU JUSTIN JIA-JEN, WANG LI-PING, FELDBAUM MICHAEL R, GAUZNER GENNADY, KUO DAVID S
Format: Patent
Sprache:eng
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Zusammenfassung:The embodiments disclose a method of stack patterning, including loading a stack into a stationary stack stage, rotating one or more ion beam grid assemblies substantially concentrically aligned with the stationary stack stage to etch the stack and controlling the operation of the one or more ion beam grid assemblies to achieve substantial axial uniformity of the etched stack.