Adjustment of measurement system components

One aspect provides a system including a sensor adjustment component comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal detectable by a sensor to be adjusted; and one or more processors; wherein the one or more processors are configu...

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Bibliographische Detailangaben
Hauptverfasser:	MOIN AREEF A, CROOK DAVID T
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	One aspect provides a system including a sensor adjustment component comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal detectable by a sensor to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information. Other aspects are disclosed.